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Brand Name : JLX
Model Number : LX-4010
Certification : ISO 17025 CNAS & ILAC Test Report
Place of Origin : Made in China
MOQ : 1
Payment Terms : T/T, Western Union
Supply Ability : 200 per month
Delivery Time : 5 working days
Packaging Details : Export standard packing
Standard : IEC60335
The stirrer shall incorporate a biased-off switch that is recessed or guarded to prevent accidental operation. It conforms to the IEC60335-2-14 requirement.
Appliance is checked by applying a cylindrical rod whose diameter is 40mm and which has a hemispherical end to touch the switch with a force not exceed 5N. The appliance shall not operated.
HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.
 
Main Products: Go No Go Gauges, IP Tester, Test Probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 Test Finger, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Security Testing Machine, Plugs and Socket Outlet Gauge, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.
If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.
We would appreciate your comments on the layout design, presentation or other aspects of our website.
Website: http://www.china-gauges.com
 
Contacts: Nina She
E-mail: sales@china-gauges.com
TEL: +86-755-33168386
FAX: +86-755-61605199
Phone: +86-15919975191
SKYPE: nina.she@outlook.com
 
Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China
ZIP: 518102
Website: http://www.china-gauges.com
 
 
 
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| 40 mm Hemispherical End Test Probe of IEC60335 Images | 
 Test Probe for Measuring Surface Temperatures of IEC 60335-2-11
                                                                                    
                        
                        
                        
                                                            Test Probe for Measuring Surface Temperatures of IEC 60335-2-11
                                                    
                        
                     8,0 mm Test Rod of IEC60335-2-14
                                                                                    
                        
                        
                        
                                                            8,0 mm Test Rod of IEC60335-2-14
                                                    
                        
                     75mm Test Probe with Hemispherical End of IEC60335
                                                                                    
                        
                        
                        
                                                            75mm Test Probe with Hemispherical End of IEC60335
                                                    
                        
                     IEC60335 UL Standard Foot Test Probe
                                                                                    
                        
                        
                        
                                                            IEC60335 UL Standard Foot Test Probe
                                                    
                        
                     jointed test finger with insulated disc 125 mm IEC/CEI EN 60335-2-14
                                                                                    
                        
                        
                        
                                                            jointed test finger with insulated disc 125 mm IEC/CEI EN 60335-2-14
                                                    
                        
                     Scratch Resistant Pin Electrical Safety Test Probe of IEC 60335-1
                                                                                    
                        
                        
                        
                                                            Scratch Resistant Pin Electrical Safety Test Probe of IEC 60335-1
                                                    
                        
                     IEC60335-2-14 Jointed Finger Test Probe with 125mm
                                                                                    
                        
                        
                        
                                                            IEC60335-2-14 Jointed Finger Test Probe with 125mm
                                                    
                        
                     IEC60065 IEC60335-1 Safety Test Finger/Short Test Probe
                                                                                    
                        
                        
                        
                                                            IEC60065 IEC60335-1 Safety Test Finger/Short Test Probe
                                                    
                        
                     Finger Nail Test Probe IEC60335
                                                                                    
                        
                        
                        
                                                            Finger Nail Test Probe IEC60335
                                                    
                        
                     IEC 60335 Access Probe Kit Access and Object Testing Probe
                                                                                    
                        
                        
                        
                                                            IEC 60335 Access Probe Kit Access and Object Testing Probe